Influence of persulfate ions on the removal of phenol in aqueous solution using electron beam irradiation
- 1. Laboratoire de Chimie et Microbiologie de l'Eau UMR CNRS 6008, Universite de Poitiers, Ecole Nationale Superieure d'Ingenieurs de Poitiers, 40 Avenue du Recteur Pineau, 86022 Poitiers Cedex (France)
Description
The removal of phenol (Co = 100 μM) during electron beam irradiation was studied in pure water and in the presence of HCO3- and Br- ions. It was found that the introduction of S2O82- ions (1 mM), by generating SO4-· radicals increases the radiation yield of phenol removal. 90% removal of phenol was obtained with radiation doses 600 and 1200 Gy with and without S2O82- ions respectively. This system induced smaller oxygen consumption with smaller concentration of catechol and hydroquinone found in the solution. HCO3- and Br- have an inhibiting effect in the presence as in the absence of S2O82-. In most cases, the introduction of S2O82- ions in water radiolysis system can advantageously increase the yield of organic compounds removal by oxidation.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jhazmat.2010.09.097Additional details
Identifiers
- DOI
- 10.1016/j.jhazmat.2010.09.097;
- PII
- S0304-3894(10)01258-6;
Publishing Information
- Journal Title
- Journal of Hazardous Materials
- Journal Volume
- 185
- Journal Issue
- 2-3
- Journal Page Range
- p. 844-851
- ISSN
- 0304-3894
- CODEN
- JHMAD9
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44022692
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ACID CARBONATES; AQUEOUS SOLUTIONS; BROMINE IONS; ELECTRON BEAMS; IRRADIATION; MINERALIZATION; OXIDATION; OXYGEN; PHENOL; RADIATION DOSES; RADICALS; RADIOLYSIS; REMOVAL; SULFATES; WATER
- Descriptors DEC
- AROMATICS; BEAMS; CHARGED PARTICLES; CHEMICAL RADIATION EFFECTS; CHEMICAL REACTIONS; DECOMPOSITION; DISPERSIONS; DOSES; ELEMENTS; HOMOGENEOUS MIXTURES; HYDROGEN COMPOUNDS; HYDROXY COMPOUNDS; IONS; LEPTON BEAMS; MIXTURES; NONMETALS; ORGANIC COMPOUNDS; OXYGEN COMPOUNDS; PARTICLE BEAMS; PHENOLS; RADIATION EFFECTS; SOLUTIONS; SULFUR COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.