Published 1990 | Version v1
Book

Synchrotron-based, high resolution computed tomography

  • 1. Advanced Research and Applications Corp., Sunnyvale, CA (United States)

Description

The development of energetic chemical systems, such as propellents and explosives, would benefit greatly from the availability of new inspection techniques which could image materials with micron-level resolution. Benefits of such a capability would include the ability to nondestructively examine samples in three dimensions at high resolution; obtain spatially resolved chemical element maps; examine void and filler-particle size and distribution; and make particle size and homogeneity maps and/or histograms. Work in the one micron range is often performed at synchrotron facilities, usually at energies and/or fluxes which are restrictively low. An initial effort to extend synchrotron-based microtomogrphy to sample sizes and scan times of practical value for the characterization of energetic materials has recently been completed. This program designed and implemented a layered-synthetic-microstructure (LSM) monochrometer to enhance by more than an order of magnitude the radiative flux available for imaging. This increased flux was traded for increased radiation energy and faster scan times. The results of this work are reported in this paper

Additional details

Publishing Information

Publisher
American Society for Nondestructive Testing.
Imprint Place
Columbus, OH (United States)
ISBN
0-931403-95-2
Imprint Title
Proceedings of the 1990 ASNT spring conference
Imprint Pagination
255 p.
Journal Page Range
p. 242.

Conference

Title
NDE - the next decade and beyond.
Acronym
Spring conference of the American Society for Nondestructive Testing
Dates
19-23 Mar 1990.
Place
San Antonio, TX (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
23008444
Subject category
S42: ENGINEERING; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPUTERIZED TOMOGRAPHY; IMAGE PROCESSING; MATERIALS; MICROSTRUCTURE; NONDESTRUCTIVE TESTING; SYNCHROTRONS
Descriptors DEC
ACCELERATORS; CRYSTAL STRUCTURE; CYCLIC ACCELERATORS; MATERIALS TESTING; TESTING; TOMOGRAPHY

Optional Information

Secondary number(s)
CONF-900385--.