Oxygen flux influence on the morphological, structural and optical properties of Zn1-xMgxO thin films grown by plasma-assisted molecular beam epitaxy
Creators
- 1. Graduate School of the Chinese Academy of Sciences, Beijing 100049 (China)
- 2. Key Laboratory of Excited State Processes, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033 (China)
- 3. College of Materials Science and Engineering, Shenzhen University, Shenzhen 518060 (China)
Description
The Zn1-xMgxO thin films were grown on Al2O3 substrate with various O2 flow rates by plasma-assisted molecular beam epitaxy (P-MBE). The growth conditions were optimized by the characterizations of morphology, structural and optical properties. The Mg content of the Zn1-xMgxO thin film increases monotonously with decreasing the oxygen flux. X-ray diffractometer (XRD) measurements show that all the thin films are preferred (0 0 2) orientated. By transmittance and absorption measurements, it was found that the band gap of the film decreases gradually with increasing oxygen flow rate. The surface morphology dependent on the oxygen flow rate was also studied by field emission scanning electron microscopy (FE-SEM). The surface roughness became significant with increasing oxygen flow rate, and the nanostructures were formed at the larger flow rate. The relationship between the morphology and the oxygen flow rate of Zn1-xMgxO films was discussed
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2008.01.132Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2008.01.132;
- PII
- S0169-4332(08)00197-9;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 254
- Journal Issue
- 15
- Journal Page Range
- p. 4886-4890
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40030070
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; ALUMINIUM OXIDES; FIELD EMISSION; FLOW RATE; MAGNESIUM OXIDES; MOLECULAR BEAM EPITAXY; MORPHOLOGY; NANOSTRUCTURES; OPTICAL PROPERTIES; OXYGEN; PLASMA; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS; ZINC OXIDES
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; DIFFRACTOMETERS; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; EPITAXY; FILMS; MAGNESIUM COMPOUNDS; MEASURING INSTRUMENTS; MICROSCOPY; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SORPTION; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.