Published May 30, 2008 | Version v1
Journal article

Oxygen flux influence on the morphological, structural and optical properties of Zn1-xMgxO thin films grown by plasma-assisted molecular beam epitaxy

  • 1. Graduate School of the Chinese Academy of Sciences, Beijing 100049 (China)
  • 2. Key Laboratory of Excited State Processes, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033 (China)
  • 3. College of Materials Science and Engineering, Shenzhen University, Shenzhen 518060 (China)

Description

The Zn1-xMgxO thin films were grown on Al2O3 substrate with various O2 flow rates by plasma-assisted molecular beam epitaxy (P-MBE). The growth conditions were optimized by the characterizations of morphology, structural and optical properties. The Mg content of the Zn1-xMgxO thin film increases monotonously with decreasing the oxygen flux. X-ray diffractometer (XRD) measurements show that all the thin films are preferred (0 0 2) orientated. By transmittance and absorption measurements, it was found that the band gap of the film decreases gradually with increasing oxygen flow rate. The surface morphology dependent on the oxygen flow rate was also studied by field emission scanning electron microscopy (FE-SEM). The surface roughness became significant with increasing oxygen flow rate, and the nanostructures were formed at the larger flow rate. The relationship between the morphology and the oxygen flow rate of Zn1-xMgxO films was discussed

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2008.01.132

Additional details

Identifiers

DOI
10.1016/j.apsusc.2008.01.132;
PII
S0169-4332(08)00197-9;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
254
Journal Issue
15
Journal Page Range
p. 4886-4890
ISSN
0169-4332
CODEN
ASUSEE

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.