Fabrication of crystallized boron films by laser ablation
Description
Polycrystalline β-rhombohedral boron films mixed with amorphous boron phase have been successfully fabricated on quartz substrates using pulsed laser ablation in a quartz glass tube chamber placed in an electric furnace. The crystallinity of the films strongly depended on the temperature of the furnace and the pressure of background argon gas. High temperature and high pressure in the chamber were suitable for crystallized boron film preparation. The best crystalline films (without B2O3 phase formation) were obtained at 1000 deg. C, 100 Pa. XPS measurements demonstrated that the major contaminants were carbon and oxygen, and the atomic ratio of oxygen to boron was 0.05 under the preparation conditions of well-crystallized films. The surface roughness of the films decreased by lowering laser energy to 150 mJ/pulse under the same pressure and temperature conditions
Additional details
Identifiers
- DOI
- 10.1016/j.jssc.2003.12.018;
- PII
- S0022459603006820;
Publishing Information
- Journal Title
- Journal of Solid State Chemistry
- Journal Volume
- 177
- Journal Issue
- 4-5
- Journal Page Range
- p. 1639-1645
- ISSN
- 0022-4596
- CODEN
- JSSCBI
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35060677
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABLATION; ARGON; BORATES; BORON; CARBON; CRYSTAL GROWTH; ELECTRIC FURNACES; FABRICATION; FILMS; LASERS; OXYGEN; PRESSURE RANGE MEGA PA 10-100; PULSED IRRADIATION; QUARTZ; ROUGHNESS; SURFACES; TEMPERATURE RANGE 1000-4000 K; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- BORON COMPOUNDS; ELECTRON SPECTROSCOPY; ELEMENTS; FLUIDS; FURNACES; GASES; IRRADIATION; MINERALS; NONMETALS; OXIDE MINERALS; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PRESSURE RANGE; PRESSURE RANGE MEGA PA; RARE GASES; SEMIMETALS; SPECTROSCOPY; SURFACE PROPERTIES; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.