Published May 2013 | Version v1
Journal article

High spatial resolution second-harmonic interferometry

  • 1. Dipartimento di Fisica E Fermi, Università degli Studi di Pisa, Largo B Pontecorvo 3, I-56127 Pisa (Italy)
  • 2. Dipartimento di Nanofisica, Istituto Italiano di Tecnologia, Via Morego 30, I-16163 Genova (Italy)

Description

A monolithic compact fully fiber coupled Nd:YAG (yttrium aluminum garnet) continuous wave laser based second-harmonic interferometer with 60 μm spatial resolution is presented. The device is tested by measuring the dispersion of laser etched polymeric films; the result found is a phase shift sensitivity down to 7 × 10−3 rad for an acquisition time as fast as 300 μs. These results demonstrate the feasibility of high spatial resolution second-harmonic interferometry, and an outlook is given for its use as a novel quantitative phase sensitive imaging technique. (letter)

Availability note (English)

Available from http://dx.doi.org/10.1088/1612-2011/10/5/056003

Additional details

Publishing Information

Journal Title
Laser physics letters (Internet)
Journal Volume
10
Journal Issue
5
Journal Page Range
[4 p.]
ISSN
1612-202X