Published September 11, 2015 | Version v1
Journal article

Atomic-scale luminescence measurement and theoretical analysis unveiling electron energy dissipation at a p-type GaAs(110) surface

  • 1. SISL RIKEN, 2-1 Hirosawa, Wako, Saitama 351-0198 (Japan)
  • 2. Department of Condensed Matter Physics, Tokyo Institute of Technology, 2-12-1 Oh-okayama, Meguro, Tokyo 152-8551 (Japan)

Description

Luminescence of p-type GaAs was induced by electron injection from the tip of a scanning tunnelling microscope into a GaAs(110) surface. Atomically-resolved photon maps revealed a significant reduction in luminescence intensity at surface electronic states localized near Ga atoms. Theoretical analysis based on first principles calculations and a rate equation approach was performed to describe the perspective of electron energy dissipation at the surface. Our study reveals that non-radiative recombination through the surface states (SS) is a dominant process for the electron energy dissipation at the surface, which is suggestive of the fast scattering of injected electrons into the SS. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/26/36/365402

Additional details

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
26
Journal Issue
36
Journal Page Range
[7 p.]
ISSN
0957-4484