Structural and transport investigation of Cd1x Mnx Te semi magnetic semiconductor system
Creators
- 1. National Center for Radiation Research and Technology, Solid State Department, P.O. Box 29, Nasr City, Cairo (Egypt)
- 2. Al Azhar University, Faculty of Science, Physics Department, Cairo (Egypt)
Description
Cd1x Mnx Te (x= 0.1, 0.2 and 0.3) have been studies. Structural characterization was carried out by X-ray diffraction. The Rietveld program reveals the formation of nano disordered structure. The lattice parameters were found to decrease by the increasing of Mn content. The dc and Ac conductivities of the prepared semi magnetic semiconductor, were measured in a wide range of temperature and frequency. The obtained data reveal that σAc (Greek Small Letter Omega) obey the relation, σAc (A Greek Small Letter Omega)=A ωsS. The Ac conductivity shows frequency dependent and nearly temperature independent character. The correlated barrier hopping conduction mechanism is applied and single electron hopping between D+ center (Mn+) and D0 (chalcogen atom) is assumed to take place. The magnetic susceptibility was investigated in the temperature range of (170-300) K revealing the paramagnetic behavior described by the Cune Weiss low
Additional details
Publishing Information
- Journal Title
- Journal of Radiation Research and Applied Sciences
- Journal Volume
- 7
- Journal Issue
- 1
- Journal Page Range
- p. 55-63
- ISSN
- 1687-8507
- CODEN
- JRRAS
INIS
- Country of Publication
- Egypt
- Country of Input or Organization
- Egypt
- INIS RN
- 50005495
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CADMIUM; ELECTRIC CONDUCTIVITY; MAGNETIC SEMICONDUCTORS; MANGANESE; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; TELLURIUM; THERMAL ANALYSIS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; MATERIALS; METALS; MICROSCOPY; PHYSICAL PROPERTIES; SCATTERING; SEMICONDUCTOR MATERIALS; SEMIMETALS; TRANSITION ELEMENTS