Published July 28, 2006
| Version v1
Journal article
Dynamic Response of Copper Subjected to Quasi-Isentropic, Gas-Gun Driven Loading
Creators
- 1. Mechanical and Aerospace Engineering Dept, Materials Science Program, University of California, San Diego, La Jolla CA 92093 0418 (United States)
- 2. Lawrence Livermore National Laboratory, Livermore CA 94550 (United States)
Description
A transmission electron microscopy study of quasi-isentropic high-pressure loading (peak pressures between 18 GPa and 52 GPa) of polycrystalline and monocrystalline copper was carried out. Deformation mechanisms and defect substructures at different pressures were analyzed. Current evidence suggests a deformation substructure consisting of twinning at the higher pressures and heavily dislocated laths and dislocation cells at the intermediate and lower pressures, respectively. Evidence of stacking faults at the intermediate pressures was also found. Dislocation cell sizes decreased with increasing pressure and increased with distance away from the surface of impact
Additional details
Identifiers
- DOI
- 10.1063/1.2263567;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 845
- Journal Issue
- 1
- Journal Page Range
- p. 1319-1322
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- American Physical Society Topical Group conference on shock compression of condensed matter
- Dates
- 31 Jul - 5 Aug 2005
- Place
- Baltimore, MD (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38043222
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COPPER; DEFORMATION; DISLOCATIONS; DISTANCE; ISENTROPIC PROCESSES; POLYCRYSTALS; PRESSURE DEPENDENCE; PRESSURE RANGE GIGA PA; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; ELECTRON MICROSCOPY; ELEMENTS; LINE DEFECTS; METALS; MICROSCOPY; PRESSURE RANGE; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2006 American Institute of Physics