Growth modes of thin films of ligand-free metal clusters
Creators
- 1. Department of Physics, University of Konstanz, Konstanz (Germany)
- 2. Departments of Chemistry and Materials Science, Johns Hopkins University, Baltimore, Maryland MD 21218 (United States)
- 3. Department of Chemistry, Sungkyunkwan University, 440-746 Suwon (Korea, Republic of)
Description
Size-selected Mon−, Wn−, and Fen− cluster anions are deposited on a weakly interacting substrate (highly oriented pyrolytic graphite) and studied ex-situ using atomic force microscopy. Depending on size, three growth modes can be distinguished. Very small clusters consisting of less than 10–30 atoms behave similar to atoms and coalesce into 3-dimensional bulk-like islands. Medium sized clusters consisting of hundreds of atoms do not coalesce and follow a Stanski-Krastanov growth pattern. At low coverage, an almost perfect monolayer is formed. This is a new finding different from all previous studies on deposited metal clusters. For clusters with several thousands of atoms, the growth pattern again changes. At low coverage, the substrate is dotted with individual clusters, while at high coverage, the surface becomes extremely rough
Additional details
Identifiers
- DOI
- 10.1063/1.4921184;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 117
- Journal Issue
- 19
- Journal Page Range
- p. 195302-195302.5
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46116092
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANIONS; ATOMIC CLUSTERS; ATOMIC FORCE MICROSCOPY; GRAPHITE; IRON; LIGANDS; MOLYBDENUM; SUBSTRATES; SURFACES; THIN FILMS; THREE-DIMENSIONAL LATTICES; TUNGSTEN
- Descriptors DEC
- CARBON; CHARGED PARTICLES; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ELEMENTS; FILMS; IONS; METALS; MICROSCOPY; MINERALS; NONMETALS; REFRACTORY METALS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC