Positron beam lifetime spectroscopy of atomic scale defect distributions in bulk and microscopic volumes
- 1. Lawrence Livermore National Lab., CA (United States)
- 2. Mount Holyoke Coll., South Hadley, MA (United States)
Description
We are developing a defect analysis capability based on two positron beam lifetime spectrometers: the first is based on a 3 MeV electrostatic accelerator and the second on our high current linac beam. The high energy beam lifetime spectrometer is operational and positron lifetime analysis is performed with a 3 MeV positron beam on thick samples. It is being used for bulk sample analysis and analysis of samples encapsulated in controlled environments for insitu measurements. A second, low energy, microscopically focused, pulsed positron beam for defect analysis by positron lifetime spectroscopies is under development at the LLNL high current positron source. This beam will enable defect specific, 3-D maps of defect concentration with sub-micron location resolution and when coupled with first principles calculations of defect specific positron lifetimes it will enable new levels of defect concentration mapping and defect identification
Availability note (English)
MF available from INIS under the Report Number; Also available from OSTI as DE96013661; NTIS; US Govt. Printing Office Dep.Files
28002084.pdf
Files
(264.9 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:7614bf9496b563744da99406c6feaad6
|
264.9 kB | Preview Download |
Additional details
Publishing Information
- Imprint Pagination
- 11 p.
- Report number
- UCRL-JC--123636
Conference
- Title
- 7. slow positron beam techniques for solids and surfaces.
- Dates
- 2-7 Jun 1996.
- Place
- Unterageri (Switzerland).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28002084
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNIHILATION; CRYSTAL DEFECTS; PLASTICS; POLYMERS; POSITRON BEAMS; SEMICONDUCTOR MATERIALS; SPECTROSCOPY
- Descriptors DEC
- BEAMS; CRYSTAL STRUCTURE; INTERACTIONS; LEPTON BEAMS; MATERIALS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PARTICLE BEAMS; PARTICLE INTERACTIONS; PETROLEUM PRODUCTS
Optional Information
- Contract/Grant/Project number
- Contract W-7405-ENG-48
- Funding organization
- USDOE, Washington, DC (United States).
- Secondary number(s)
- CONF-9606252--2.