Amorphous CuxGa1-xO film deposition by ultrahigh vacuum radio frequency magnetron sputtering
Creators
- 1. Japan
- 2. Waseda Univ., School of Science and Engineering, Tokyo (JP)
- 3. Waseda Univ., Kagami Memorial Laboratory for Material Science and Technologies, Tokyo (JP)
Description
Amorphous Ga2O3 and CuxGa1-xO thin films were prepared on glass substrates by ultrahigh-vacuum radio frequency magnetron sputtering at room temperature. The films of amorphous Ga2O3 show a very high transmittance (nearly 90%). As the oxygen partial pressure increases, a dramatic shift is observed in the optical band gap of the films. The band gap energies of the films are determined by a liner fit of the transmittance spectra and are estimated to be between 4.9 and 5.3 eV. Band gap energies of amorphous CuxGa1-xO films are also estimated by the same method. They show prominent bowing characteristics with a bowing parameter as large as 9.1 eV. The band gap energy of amorphous Cu0.5Ga0.5O is formed to be much smaller than that of crystalline CuGaO2. (author)
Additional details
Publishing Information
- Journal Title
- Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications and Review Papers
- Journal Volume
- 46
- Journal Issue
- 4B
- Journal Page Range
- p. 2527-2529
- ISSN
- 0021-4922
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 39005967
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMORPHOUS STATE; BINDING ENERGY; COPPER COMPOUNDS; GALLIUM OXIDES; GRADED BAND GAPS; LIGHT TRANSMISSION; MAGNETRONS; OPTICAL PROPERTIES; PRESSURE RANGE NANO PA; SAMPLE PREPARATION; SCANNING ELECTRON MICROSCOPY; SPUTTERING; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ENERGY; EQUIPMENT; FILMS; GALLIUM COMPOUNDS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; PRESSURE RANGE; SCATTERING; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; TRANSMISSION
Optional Information
- Notes
- 9 refs., 5 figs.