Published April 2007 | Version v1
Journal article

Amorphous CuxGa1-xO film deposition by ultrahigh vacuum radio frequency magnetron sputtering

  • 1. Japan
  • 2. Waseda Univ., School of Science and Engineering, Tokyo (JP)
  • 3. Waseda Univ., Kagami Memorial Laboratory for Material Science and Technologies, Tokyo (JP)

Description

Amorphous Ga2O3 and CuxGa1-xO thin films were prepared on glass substrates by ultrahigh-vacuum radio frequency magnetron sputtering at room temperature. The films of amorphous Ga2O3 show a very high transmittance (nearly 90%). As the oxygen partial pressure increases, a dramatic shift is observed in the optical band gap of the films. The band gap energies of the films are determined by a liner fit of the transmittance spectra and are estimated to be between 4.9 and 5.3 eV. Band gap energies of amorphous CuxGa1-xO films are also estimated by the same method. They show prominent bowing characteristics with a bowing parameter as large as 9.1 eV. The band gap energy of amorphous Cu0.5Ga0.5O is formed to be much smaller than that of crystalline CuGaO2. (author)

Additional details

Publishing Information

Journal Title
Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications and Review Papers
Journal Volume
46
Journal Issue
4B
Journal Page Range
p. 2527-2529
ISSN
0021-4922

Optional Information

Notes
9 refs., 5 figs.