Published December 15, 1974
| Version v1
Journal article
Josephson tunneling through locally thinned silicon wafers
Creators
- 1. Department of Electrical Engineering and Computer Sciences, and the Electronics Research Laboratory, University of California, Berkeley, California 94720
Description
We have made and tested Josephson junctions in which tunneling takes place through a locally thinned region in a single-crystal silicon wafer. An etching technique is used to produce a square uniform thinned layer, 87.5 μm on a side and ≈400 Å thick. After removal of the oxide layer, superconducting metals are deposited on both sides. Temperature and magnetic field dependences of the critical current, as well as the magnitude of the current, conform very closely to the theory for a Josephson tunnel junction. This is the first type of Josephson junction employing a barrier which is accessible for modification prior to deposition of the superconducting electrodes.
Additional details
Identifiers
- DOI
- 10.1063/1.1655388;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 25
- Journal Issue
- 12
- Series
- Appl. Phys. Lett.
- Journal Page Range
- 753-756
- ISSN
- 0003-6951
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 6175356
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BORON; CRITICAL CURRENT; ETCHING; FERMI LEVEL; INTERFACES; JOSEPHSON EFFECT; JOSEPHSON JUNCTIONS; MAGNETIC FIELDS; SILICON; SUPERCONDUCTIVITY; TEMPERATURE DEPENDENCE; TUNNEL EFFECT
- Descriptors DEC
- CURRENTS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELEMENTS; ENERGY LEVELS; PHYSICAL PROPERTIES; SEMICONDUCTOR JUNCTIONS; SEMIMETALS; SURFACE FINISHING
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent