Published December 15, 1974 | Version v1
Journal article

Josephson tunneling through locally thinned silicon wafers

  • 1. Department of Electrical Engineering and Computer Sciences, and the Electronics Research Laboratory, University of California, Berkeley, California 94720

Description

We have made and tested Josephson junctions in which tunneling takes place through a locally thinned region in a single-crystal silicon wafer. An etching technique is used to produce a square uniform thinned layer, 87.5 μm on a side and ≈400 Å thick. After removal of the oxide layer, superconducting metals are deposited on both sides. Temperature and magnetic field dependences of the critical current, as well as the magnitude of the current, conform very closely to the theory for a Josephson tunnel junction. This is the first type of Josephson junction employing a barrier which is accessible for modification prior to deposition of the superconducting electrodes.

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
25
Journal Issue
12
Series
Appl. Phys. Lett.
Journal Page Range
753-756
ISSN
0003-6951

Optional Information

Notes
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