Published August 2007 | Version v1
Journal article Metadata-only

Structural and optical properties of Bi3.25Nd0.75Ti3O12 ferroelectric thin films

Creators

  • 1. Chinese Academy of Sciences, National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Shanghai (China)

Description

Ferroelectric Bi3.25Nd0.75Ti3O12 (BNT) thin films were grown on (111)Pt/Ti/SiO2/Si substrates by a chemical solution method. The films were composed of large rod-like grains. XRD and Raman spectroscopy measurements showed they were polycrystalline perovskite structure with a good crystallinity. Pt/BNT/Pt capacitors had been fabricated and showed good ferroelectricity. The optical constants (n,k) of BNT thin films in the wavelength ranges of 0.2-1.7 μm and 2.5-11.4 μm were obtained by spectroscopic ellipsometry measurements. The dispersion of the refractive index in the interband transition region followed the single electronic oscillator model. The optical band gap was found to be about 3.61 eV. (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1007/s00339-007-4014-9

Additional details

Identifiers

DOI
10.1007/s00339-007-4014-9;

Publishing Information

Journal Title
Applied Physics. A, Materials Science and Processing
Journal Volume
88
Journal Issue
2
Journal Page Range
p. 439-442
ISSN
0947-8396
CODEN
APAMFC

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
38074481
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ABSORPTION SPECTRA; BAND THEORY; BISMUTH COMPOUNDS; CAPACITORS; CUBIC LATTICES; DIELECTRIC PROPERTIES; ELECTRIC FIELDS; ELECTRONIC STRUCTURE; ELLIPSOMETRY; ENERGY GAP; ENERGY-LEVEL TRANSITIONS; FERROELECTRIC MATERIALS; HYSTERESIS; INFRARED SPECTRA; NEODYMIUM COMPOUNDS; OPACITY; OPTICAL DISPERSION; PLATINUM; POLYCRYSTALS; RAMAN SPECTRA; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON OXIDES; SPECTRAL SHIFT; SUBSTRATES; THIN FILMS; TITANATES; TITANIUM; ULTRAVIOLET SPECTRA; VISIBLE SPECTRA; X-RAY DIFFRACTION
Descriptors DEC
CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; DIELECTRIC MATERIALS; DIFFRACTION; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; EQUIPMENT; FILMS; MATERIALS; MEASURING METHODS; METALS; MICROSCOPY; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; PLATINUM METALS; RARE EARTH COMPOUNDS; SCATTERING; SEMIMETALS; SILICON COMPOUNDS; SPECTRA; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS