Published October 25, 2010
| Version v1
Journal article
Formation of void lattice after annealing of Ge quantum dot lattice in alumina matrix
Creators
- 1. University of Minho, Campus of Gualtar, 4710-057 Braga (Portugal)
- 2. Ruder Boskovic Institute, Bijenicka cesta 54, 10000 Zagreb (Croatia)
- 3. Forschungszentrum Dresden-Rossendorf, e.V., P.O. Box 510119, 01314 Dresden (Germany)
- 4. Physics Centre, University of Essex, Colchester CO4 3SQ (United Kingdom)
- 5. Sincrotrone Trieste, SS 14 km163, 5, 34012 Basovizza (Italy)
Description
We report on the formation of a regularly ordered void lattice with a void size of about 4 nm in an alumina matrix. The voids were formed by thermal treatment of a well-ordered three-dimensional Ge quantum dot lattice formed earlier by self-assembled growth in an alumina matrix during magnetron sputtering codeposition of Ge+Al2O3. During the subsequent annealing the germanium atoms were lost from the film and so voids were produced. The positions of the voids are ordered in the same way as the Ge quantum dots that were present before annealing, while their sizes can be controlled by the deposition parameters.
Additional details
Identifiers
- DOI
- 10.1063/1.3499426;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 97
- Journal Issue
- 17
- Journal Page Range
- p. 173113-173113.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42058369
- Subject category
- S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ALUMINIUM OXIDES; ANNEALING; ATOMS; CRYSTAL GROWTH; DEPOSITION; FILMS; GERMANIUM; MATRIX MATERIALS; QUANTUM DOTS; SEMICONDUCTOR MATERIALS; SOLIDS; SPUTTERING; VOIDS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; ELEMENTS; HEAT TREATMENTS; MATERIALS; METALS; NANOSTRUCTURES; OXIDES; OXYGEN COMPOUNDS
Optional Information
- Notes
- (c) 2010 American Institute of Physics