Published October 25, 2010 | Version v1
Journal article

Formation of void lattice after annealing of Ge quantum dot lattice in alumina matrix

  • 1. University of Minho, Campus of Gualtar, 4710-057 Braga (Portugal)
  • 2. Ruder Boskovic Institute, Bijenicka cesta 54, 10000 Zagreb (Croatia)
  • 3. Forschungszentrum Dresden-Rossendorf, e.V., P.O. Box 510119, 01314 Dresden (Germany)
  • 4. Physics Centre, University of Essex, Colchester CO4 3SQ (United Kingdom)
  • 5. Sincrotrone Trieste, SS 14 km163, 5, 34012 Basovizza (Italy)

Description

We report on the formation of a regularly ordered void lattice with a void size of about 4 nm in an alumina matrix. The voids were formed by thermal treatment of a well-ordered three-dimensional Ge quantum dot lattice formed earlier by self-assembled growth in an alumina matrix during magnetron sputtering codeposition of Ge+Al2O3. During the subsequent annealing the germanium atoms were lost from the film and so voids were produced. The positions of the voids are ordered in the same way as the Ge quantum dots that were present before annealing, while their sizes can be controlled by the deposition parameters.

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
97
Journal Issue
17
Journal Page Range
p. 173113-173113.3
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42058369
Subject category
S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ALUMINIUM OXIDES; ANNEALING; ATOMS; CRYSTAL GROWTH; DEPOSITION; FILMS; GERMANIUM; MATRIX MATERIALS; QUANTUM DOTS; SEMICONDUCTOR MATERIALS; SOLIDS; SPUTTERING; VOIDS
Descriptors DEC
ALUMINIUM COMPOUNDS; CHALCOGENIDES; ELEMENTS; HEAT TREATMENTS; MATERIALS; METALS; NANOSTRUCTURES; OXIDES; OXYGEN COMPOUNDS

Optional Information

Notes
(c) 2010 American Institute of Physics