Published March 2007 | Version v1
Journal article

Magnetization under high-pressure in organic ferromagnet α-TDAE-C60

  • 1. Graduate school of Natural Science and Technology, Okayama University, 3-1-1 Tushima-naka, Okayama 700-8530 (Japan)
  • 2. Institute for Molecular Science, Myodaiji, Okazaki 444-8585 (Japan)

Description

The magnetization measurements under pressure were performed on the fullerene-based ferromagnet, α-TDAE-C60. We found that the saturation magnetization below the ferromagnetic ordering temperature Tc is rapidly suppressed with increasing pressure and disappeared above Pc2=0.1-0.2GPa. This pressure is remarkably lower than the critical pressure of polymerization Pc=0.7GPa. On the contrary, Tc is almost pressure independent below Pc2, but, above Pc2, could not be entirely determined because of the strong suppression of the magnetization. In the paramagnetic region, the susceptibility under pressure indicates the total number of spins remains unchanged around Pc2 as well as Pc. We discuss these results compared with the high-pressure ESR

Additional details

Identifiers

DOI
10.1016/j.jmmm.2006.10.661;
PII
S0304-8853(06)01661-1;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
310
Journal Issue
2
Journal Page Range
p. 1432-1434
ISSN
0304-8853
CODEN
JMMMDC

Conference

Title
17. international conference on magnetism
Dates
20-25 Aug 2006
Place
Kyoto (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39029749
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRITICAL PRESSURE; ELECTRON SPIN RESONANCE; FULLERENES; MAGNETIZATION; PARAMAGNETISM; POLYMERIZATION; PRESSURE RANGE MEGA PA 100-1000; SPIN
Descriptors DEC
ANGULAR MOMENTUM; CARBON; CHEMICAL REACTIONS; ELEMENTS; MAGNETIC RESONANCE; MAGNETISM; NONMETALS; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; PRESSURE RANGE; PRESSURE RANGE MEGA PA; RESONANCE; THERMODYNAMIC PROPERTIES

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.