Single-photon imaging
- 1. CSEM SA, Landquart (Switzerland)
- 2. Technische Univ. Delft (Netherlands)
Description
The acquisition and interpretation of images is a central capability in almost all scientific and technological domains. In particular, the acquisition of electromagnetic radiation, in the form of visible light, UV, infrared, X-ray, etc. is of enormous practical importance. The ultimate sensitivity in electronic imaging is the detection of individual photons. With this book, the first comprehensive review of all aspects of single-photon electronic imaging has been created. Topics include theoretical basics, semiconductor fabrication, single-photon detection principles, imager design and applications of different spectral domains. Today, the solid-state fabrication capabilities for several types of image sensors has advanced to a point, where uncooled single-photon electronic imaging will soon become a consumer product. This book is giving a specialist's view from different domains to the forthcoming ''single-photon imaging'' revolution. The various aspects of single-photon imaging are treated by internationally renowned, leading scientists and technologists who have all pioneered their respective fields. (orig.)
Availability note (English)
Also electronically available via http://dx.doi.org/10.1007/978-3-642-18443-7Additional details
Identifiers
Publishing Information
- Publisher
- Springer
- Imprint Place
- Berlin (Germany)
- ISBN
- 978-3-642-18442-0
- Imprint Pagination
- 369 p.
- Journal Volume
- 160
- Series
- Springer Series in Optical Sciences
- ISSN
- 0342-4111
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 42095074
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BACKGROUND NOISE; CHARGE-COUPLED DEVICES; LECTURES; PHOTODETECTORS; PHOTODIODES; POSITION SENSITIVE DETECTORS; RADIOASTRONOMY; SEMICONDUCTOR DETECTORS; X-RAY DETECTION; X-RAY RADIOGRAPHY
- Descriptors DEC
- ASTRONOMY; DETECTION; DOCUMENT TYPES; INDUSTRIAL RADIOGRAPHY; MATERIALS TESTING; MEASURING INSTRUMENTS; NOISE; NONDESTRUCTIVE TESTING; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TESTING