Electrical transport and magnetic properties in La0.67Ca0.33MnO3 and CuFe2O4 composites
Creators
- 1. Department of Physics, Huazhong University of Science and Technology, Wuhan 430074 (China)
Description
The (1 - x) La0.67Ca0.33MnO3/xCuFe2O4 (x = 0, 0.04, 0.07, 0.10 and 0.15) composites have been prepared and investigated systematically for their microstructure, electrical and magnetic properties. The X-ray diffraction and scanning electronic microscopy analysis reveal that both La0.67Ca0.33MnO3 (LCMO) and CuFe2O4 phases are distributed in the composites. Compared with pure LCMO, an obvious enhancement of magnetoresistance is observed over a wide temperature range for the composites. Under 3 T field, the magnetoresistance rises from a base value 44.5% for pure LCMO, to a maximum value of 66.7% for x = 0.1 composite. Meanwhile, a weak temperature-dependent MR platform is observed in the temperature range from 210 K to 240 K. The MR enhancement is discussed in terms of spin-polarized intergrain tunneling due to enhanced magnetic disorder and magnetic coupling near boundaries between LCMO and CuFe2O4 grains
Availability note (English)
Available from http://dx.doi.org/10.1016/j.mseb.2008.01.002Additional details
Identifiers
- DOI
- 10.1016/j.mseb.2008.01.002;
- PII
- S0921-5107(08)00015-9;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 150
- Journal Issue
- 1
- Journal Page Range
- p. 50-54
- ISSN
- 0921-5107
- CODEN
- MSBTEK
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40036267
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHARGED-PARTICLE TRANSPORT; COUPLING; FERROMAGNETIC MATERIALS; MAGNETIC PROPERTIES; MAGNETORESISTANCE; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SPIN ORIENTATION; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0065-0273 K; TUNNEL EFFECT; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; MAGNETIC MATERIALS; MATERIALS; MICROSCOPY; ORIENTATION; PHYSICAL PROPERTIES; RADIATION TRANSPORT; SCATTERING; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.