Birefringence dynamics of poly{1-[4-(3-carboxy-4-hydroxyphenylazo)benzenesulfonamido]-1,2-ethanediyl, sodium salt} cast films
Creators
- 1. Centro de Fisica e Investigacao Tecnologica CEFITEC, Departamento de Fisica, Faculdade de Ciencias e Tecnologia, Universidade Nova de Lisboa, Campus da Caparica, 2829-516 Caparica (Portugal)
- 2. Instituto de Fisica, Universidade Federal de Uberlandia, 38400902, Uberlandia, MG (Brazil)
- 3. REQUIMTE, CQFB, Departamento de Quimica, Faculdade de Ciencias e Tecnologia, Universidade Nova de Lisboa, 2829-516 Caparica (Portugal)
- 4. Institute of Experimental Physics, Ulm University, Albert-Einstein-Allee 11, 89069 Ulm (Germany)
Description
Photoinduced birefringence creation/decay dynamics in poly{1-[4-(3-carboxy-4-hydroxyphenylazo)benzenesulfonamido]-1,2-ethanediyl, sodium salt}cast films, has been characterized in the 5 to 100 mW writing laser power range at the wavelength of 514 nm. The maximum birefringence magnitude increased with laser beam power, being the largest value of 0.03, measured at 632.8 nm. Birefringence creation kinetics followed a biexponential behavior, where a slow process and a fast process could be clearly distinguished. The fast process accounted for more than 60% of birefringence. The time constants for both fast and slow processes decreased with increasing power of writing beam. Birefringence relaxation after removal of writing laser beam revealed to be independent of beam power and, was found to be ruled by two processes, described by a biexponential curve plus a constant term accounting for residual birefringence. A high residual birefringence signal of 85 ± 3% was attained, with the fast process contributing to 67% of decay from maximum value. The large values obtained for time constants for both birefringence creation and relaxation processes are believed to arise from stabilization of azo-group either by the formation of an ionic network, or by local short range interactions that are coming through as a result polyelectrolyte coiling due to its high degree of ionization.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2011.06.102Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2011.06.102;
- PII
- S0040-6090(11)01379-4;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 519
- Journal Issue
- 22
- Journal Page Range
- p. 8191-8196
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43052172
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BEAMS; BIREFRINGENCE; DECAY; INTERACTION RANGE; KINETICS; LASERS; POWER RANGE; RELAXATION; SIGNALS; SODIUM; STABILIZATION; THIN FILMS
- Descriptors DEC
- ALKALI METALS; DISTANCE; ELEMENTS; FILMS; METALS; REFRACTION
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.