Colloquium: Femtosecond x-ray crystallography
- 1. Laboratoire pour l'Utilisation des Lasers Intense, Ecole Polytechnique, UMR 7605 CNRS, F-91128 Palaiseau (France)
- 2. Niels Bohr Institute, Blegdamsvej 17, DK-2100 Copenhagen (Denmark)
- 3. Department of Mathematics and Physics, Royal Veterinary and Agricultural University, Thorvaldsensvej 40, DK-1871 Frederiksberg C (Denmark)
- 4. Laboratoire d'Optique Appliquee, ENSTA/Ecole Polytechnique, UMR 7639 CNRS, Chemin de la Huniere, F-91761 Palaiseau (France)
Description
This article gives an overview of recent x-ray diffraction experiments with time resolutions down to 10-13 s. The scientific motivation behind the development is outlined, using examples from solid state physics and biology. The ultrafast resolution may be provided either by fast detectors or short x-ray pulses, and the limitations of both techniques are discussed on the basis of state of the art experiments. In particular, it is shown that with present designs, high time resolution reduces the structural information attainable with high spatial resolution, thereby limiting feasible experiments on the ultrashort time-scale. The first experiment showing subpicosecond conformation changes was recently achieved with simple solids using an ultrafast laser-produced plasma x-ray source. The principles of this experiment are described in detail
Additional details
Identifiers
Publishing Information
- Journal Title
- Reviews of Modern Physics
- Journal Volume
- 73
- Journal Issue
- 1
- Journal Page Range
- p. 17-31
- ISSN
- 0034-6861
- CODEN
- RMPHAT
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35008817
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRYSTALLOGRAPHY; DIFFRACTOMETERS; NEUTRON DIFFRACTION; TIME RESOLUTION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; MEASURING INSTRUMENTS; RESOLUTION; SCATTERING; TIMING PROPERTIES
Optional Information
- Notes
- (c) 2001 The American Physical Society