Burgers vector analysis of large area misfit dislocation arrays from bend contour contrast in transmission electron microscope images

A transmission electron microscopy method is described which allows us to determine the Burgers vectors (BVs) of a large number of interfacial misfit dislocations (MDs) in mismatched heterostructures. The method combines large-area plan-view thinning of the sample for creating a strongly bent electron transparent foil with the analysis of the splitting and displacement of bend contours at their crossings with the MDs. The BV analysis is demonstrated for 60 deg. MDs in a low-mismatched SiGe/Si(001) heterostructure. Crossings of various bend contours with the MDs are analysed with respect to their information content for the BV analysis. In future applications the method may be used for analysing such a large number of MDs that a quantitative comparison with x-ray diffraction experiments, especially with data on diffusely scattered x-rays originating from the strain fields around the dislocations, becomes possible