Published May 2009 | Version v1
Journal article Metadata-only

Microstructures and impedance studies of Bi3.15Nd0.85Ti3O12 thin films

Creators

  • 1. Nanjing University, National Laboratory of Solid State Microstructures and Department of Materials Science and Engineering, Nanjing (China)

Description

Microstructures and impedance characteristics of chemical-solution-derived Bi3.15Nd0.85Ti3O12 thin films were studied as functions of temperature. A dielectric anomaly was found at around 450 C, corresponding to the paraelectric to ferroelectric transition. Via complex impedance studies, grain and grain boundary contributions to the impedance were separated. The resistance of grain and grain boundaries is found governed by the same kind of space charge with an activation energy around 1.1 eV, close to that of oxygen vacancies in perovskite ferroelectrics. The low temperature ac conductance of BNdT thin films shows a frequency dispersion, which can also be ascribed to space charges mainly due to oxygen vacancies. The results were compared with SrBi2Ta2O9 in terms of oxygen vacancy conductivity. (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1007/s00339-008-4935-y

Additional details

Identifiers

DOI
10.1007/s00339-008-4935-y;

Publishing Information

Journal Title
Applied Physics. A, Materials Science and Processing
Journal Volume
95
Journal Issue
2
Journal Page Range
p. 517-521
ISSN
0947-8396
CODEN
APAMFC

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
40035250
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ACTIVATION ENERGY; ALTERNATING CURRENT; BISMUTH COMPOUNDS; ELECTRIC CONDUCTIVITY; ELECTRIC IMPEDANCE; FERROELECTRIC MATERIALS; FREQUENCY DEPENDENCE; GRAIN BOUNDARIES; HZ RANGE; KHZ RANGE 01-100; KHZ RANGE 100-1000; NEODYMIUM COMPOUNDS; PERMITTIVITY; PHASE TRANSFORMATIONS; SPACE CHARGE; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; THIN FILMS; TITANATES; TRANSMISSION ELECTRON MICROSCOPY; VACANCIES; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CURRENTS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ENERGY; FILMS; FREQUENCY RANGE; IMPEDANCE; KHZ RANGE; MATERIALS; MICROSCOPY; MICROSTRUCTURE; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; POINT DEFECTS; RARE EARTH COMPOUNDS; SCATTERING; TEMPERATURE RANGE; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS