Published May 15, 2003 | Version v1
Journal article

Effect of orientation stability on recrystallization textures of deformed aluminium single crystals

Description

High purity Al single crystals of the Cube (0 0 1)[1 0 0] and rotated Cube (0 1 1)[0 1 1-bar] orientations have been deformed in plane strain compression in a channel die. Deformation was carried out at temperatures between 25 and 600 deg. C up to strains of 1.2. The as-deformed microstructure has been characterised using electron microscopy and electron backscattered diffraction (EBSD). Annealing was carried out for various times and temperatures. The recrystallized microstructure has been studied using electron microscopy, and the orientation of recrystallized grains determined using EBSD. After cold deformation and annealing both orientations exhibited a random recrystallization texture component. After hot deformation both orientations retained a similar annealing texture to their starting deformation texture. The annealing texture of deformed single crystals was found to be more sensitive to the temperature of deformation than the stability of the orientation

Additional details

Identifiers

DOI
10.1016/S0921-5093(02)00748-7;
arXiv
arXiv:hep-lat/9608117v1;
PII
S0921509302007487;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
348
Journal Issue
1-2
Journal Page Range
p. 154-162
ISSN
0921-5093
CODEN
MSAPE3

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38069926
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALUMINIUM; ANNEALING; BACKSCATTERING; COMPRESSION; DEFORMATION; DIES; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; IMPURITIES; MICROSTRUCTURE; MONOCRYSTALS; ORIENTATION; RECRYSTALLIZATION; STABILITY; STRAINS; TEXTURE
Descriptors DEC
COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELEMENTS; HEAT TREATMENTS; METALS; MICROSCOPY; SCATTERING

Optional Information

Copyright
Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.