Effect of orientation stability on recrystallization textures of deformed aluminium single crystals
Creators
Description
High purity Al single crystals of the Cube (0 0 1)[1 0 0] and rotated Cube (0 1 1)[0 1 1-bar] orientations have been deformed in plane strain compression in a channel die. Deformation was carried out at temperatures between 25 and 600 deg. C up to strains of 1.2. The as-deformed microstructure has been characterised using electron microscopy and electron backscattered diffraction (EBSD). Annealing was carried out for various times and temperatures. The recrystallized microstructure has been studied using electron microscopy, and the orientation of recrystallized grains determined using EBSD. After cold deformation and annealing both orientations exhibited a random recrystallization texture component. After hot deformation both orientations retained a similar annealing texture to their starting deformation texture. The annealing texture of deformed single crystals was found to be more sensitive to the temperature of deformation than the stability of the orientation
Additional details
Identifiers
- DOI
- 10.1016/S0921-5093(02)00748-7;
- arXiv
- arXiv:hep-lat/9608117v1;
- PII
- S0921509302007487;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 348
- Journal Issue
- 1-2
- Journal Page Range
- p. 154-162
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38069926
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM; ANNEALING; BACKSCATTERING; COMPRESSION; DEFORMATION; DIES; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; IMPURITIES; MICROSTRUCTURE; MONOCRYSTALS; ORIENTATION; RECRYSTALLIZATION; STABILITY; STRAINS; TEXTURE
- Descriptors DEC
- COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELEMENTS; HEAT TREATMENTS; METALS; MICROSCOPY; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.