Electrostatic deposition of a micro solder particle using a single probe by applying a single rectangular pulse
- 1. Department of Mechanical and Aerospace Engineering, Graduate School of Science and Engineering, Tokyo Institute of Technology 2-12-1 O-okayama, Meguro-ku, Tokyo 152-8552 (Japan)
- 2. Department of International Development Engineering, Graduate School of Science and Engineering, Tokyo Institute of Technology 2-12-1 O-okayama, Meguro-ku, Tokyo 152-8552 (Japan)
Description
Recently, micromanipulation techniques have been in high demand. A technique to deposit a metal microparticle onto a metal substrate by using a single metal probe has been proposed as one of the techniques. A solder particle with a diameter of 20–30 µm, initially adhering to the probe tip, is detached and deposited onto a substrate. The success rate of the particle deposition was 44% in the previous research, and is insufficient for industrial applications. In this paper, a technique of particle deposition by applying a single rectangular pulse is proposed, and the mechanism of the deposition is described. In the mechanism, an electric discharge between the probe and the particle when the particle reaches the substrate plays an important role in the particle deposition. Moreover, the mechanism of the proposed technique is verified by experiments of particle deposition, which are observed using a high-speed camera, a scanning electron microscope (SEM) and an oscilloscope. The success rate of the particle deposition has increased to 93% by the proposed technique. Furthermore, the damage to the particle by the electric discharge is evaluated using an RC circuit model, and the applicability of the proposed technique is discussed. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0960-1317/22/8/085003Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Micromechanics and Microengineering. Structures, Devices and Systems
- Journal Volume
- 22
- Journal Issue
- 8
- Journal Page Range
- [9 p.]
- ISSN
- 0960-1317
- CODEN
- JMMIEZ
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47054032
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CAMERAS; DAMAGE; DEPOSITION; DEPOSITS; ELECTRIC DISCHARGES; METALS; PARTICLES; PROBES; PULSES; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; VELOCITY
- Descriptors DEC
- ELECTRON MICROSCOPY; ELEMENTS; MICROSCOPY