Published August 2012 | Version v1
Journal article

Electrostatic deposition of a micro solder particle using a single probe by applying a single rectangular pulse

  • 1. Department of Mechanical and Aerospace Engineering, Graduate School of Science and Engineering, Tokyo Institute of Technology 2-12-1 O-okayama, Meguro-ku, Tokyo 152-8552 (Japan)
  • 2. Department of International Development Engineering, Graduate School of Science and Engineering, Tokyo Institute of Technology 2-12-1 O-okayama, Meguro-ku, Tokyo 152-8552 (Japan)

Description

Recently, micromanipulation techniques have been in high demand. A technique to deposit a metal microparticle onto a metal substrate by using a single metal probe has been proposed as one of the techniques. A solder particle with a diameter of 20–30 µm, initially adhering to the probe tip, is detached and deposited onto a substrate. The success rate of the particle deposition was 44% in the previous research, and is insufficient for industrial applications. In this paper, a technique of particle deposition by applying a single rectangular pulse is proposed, and the mechanism of the deposition is described. In the mechanism, an electric discharge between the probe and the particle when the particle reaches the substrate plays an important role in the particle deposition. Moreover, the mechanism of the proposed technique is verified by experiments of particle deposition, which are observed using a high-speed camera, a scanning electron microscope (SEM) and an oscilloscope. The success rate of the particle deposition has increased to 93% by the proposed technique. Furthermore, the damage to the particle by the electric discharge is evaluated using an RC circuit model, and the applicability of the proposed technique is discussed. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0960-1317/22/8/085003

Additional details

Publishing Information

Journal Title
Journal of Micromechanics and Microengineering. Structures, Devices and Systems
Journal Volume
22
Journal Issue
8
Journal Page Range
[9 p.]
ISSN
0960-1317
CODEN
JMMIEZ

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47054032
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CAMERAS; DAMAGE; DEPOSITION; DEPOSITS; ELECTRIC DISCHARGES; METALS; PARTICLES; PROBES; PULSES; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; VELOCITY
Descriptors DEC
ELECTRON MICROSCOPY; ELEMENTS; MICROSCOPY