Studies on YBCO and BSCCO thick film rf-SQUIDs at liquid nitrogen temperatures
Creators
- 1. National Physical Lab., New Delhi (India)
Description
RF-SQUID behaviour in YBCO and BSCCO thick films has been studied by patterning a hole interrupted with a microbridge type of structure on the films. YBCO film used for the rf-SQUID fabrication had mixed orientation with Tc(R=0) of 91K, whereas BSCCO film had predominantly c-axis oriented high-Tc 2223 phase with Tc(R=0) of 104K. Voltage-flux (V=Φ) modulations in YBCO rf-SQUID have been observed up to 85.1K, whereas, in BSCCO rf-SQUID, the modulations were present up to 98K. Both the SQUIDS have been operated successfully in flux-locked-loop mode at 77K. Both YBCO and BSCCO rf-SQUIDs showed single periodicity in V-Φ modulations corresponding to the area of the SQUID loop. Flux noise density, √S sub(Φ) ∼ 5 x 10-4 Φ0/√Hz for BSCCO rf-SQUID is found to be less than YBCO rf-SQUID (1 X 10-3Φ0/√Hz) at 77K in the white noise region (f> 1Hz). As compared to YBCO rf-SQUID, BSCCO rf-SQUID has been found to be more stable even after several thermal cycling. (author). 13 refs., 18 figs., 1 tab
Additional details
Publishing Information
- Journal Title
- Indian Journal of Pure and Applied Physics
- Journal Volume
- 32
- Journal Issue
- 1
- Journal Page Range
- p. 39-48.
- ISSN
- 0019-5596
- CODEN
- IJOPAU
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 26032142
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BARIUM OXIDES; CALCIUM OXIDES; COPPER OXIDES; FABRICATION; FILMS; GRAIN SIZE; HIGH-TC SUPERCONDUCTORS; HYSTERESIS; PERFORMANCE; RADIOWAVE RADIATION; SCANNING ELECTRON MICROSCOPY; SPECIFICATIONS; SQUID DEVICES; STRONTIUM OXIDES; TEMPERATURE RANGE 0065-0273 K; THERMAL CYCLING; THICKNESS; X-RAY DIFFRACTION; YTTRIUM OXIDES
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BARIUM COMPOUNDS; CALCIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; CRYSTAL STRUCTURE; DIFFRACTION; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; EQUIPMENT; FLUXMETERS; MEASURING INSTRUMENTS; MICROSCOPY; MICROSTRUCTURE; MICROWAVE EQUIPMENT; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SCATTERING; SIZE; STRONTIUM COMPOUNDS; SUPERCONDUCTING DEVICES; SUPERCONDUCTORS; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS