Published June 21, 1996 | Version v1
Journal article Metadata-only

High-resolution von Hamos crystal X-ray spectrometer

Creators

  • 1. Fribourg Univ. (Switzerland). Physics Dept.

Description

A high-resolution von Hamos Bragg crystal X-ray spectrometer is described. The instrument was designed for the study of X-ray emission from low-Z elements and L X-ray spectra of medium to high Z targets induced by photon and particle impact. The construction details and operational characteristics of the spectrometer are presented along with the data illustrating the utility of this facility in different areas of research in atomic physics. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
376
Journal Issue
1
Journal Page Range
p. 129-138.
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
27060180
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ARGON; BRAGG REFLECTION; CHARGE-COUPLED DEVICES; COPPER; COUNTING CIRCUITS; DATA ACQUISITION SYSTEMS; EMISSION SPECTRA; ENERGY RESOLUTION; ENERGY SPECTRA; K SHELL; KRYPTON; L SHELL; MOLYBDENUM; MOLYBDENUM OXIDES; MOLYBDENUM SILICIDES; SEMICONDUCTOR DETECTORS; SILICON OXIDES; URANIUM; X-RAY DETECTION; X-RAY SPECTRA; X-RAY SPECTROMETERS
Descriptors DEC
ACTINIDES; CHALCOGENIDES; DETECTION; ELECTRONIC CIRCUITS; ELECTRONIC STRUCTURE; ELEMENTS; MEASURING INSTRUMENTS; METALS; MOLYBDENUM COMPOUNDS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; RADIATION DETECTION; RADIATION DETECTORS; RARE GASES; REFLECTION; RESOLUTION; SEMICONDUCTOR DEVICES; SILICIDES; SILICON COMPOUNDS; SPECTRA; SPECTROMETERS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS