Published March 1984
| Version v1
Book
Developments of nuclear microprobe for PIXE analysis
Description
The capabilities of PIXE analysis with nuclear microbeams are described compared with the electron microprobe analysis which is the most widely used technique of positional analysis. The production of nuclear microprobes either by collimation or by focussing is described. Various focussing lenses used so far are compared and the factors which limit the achievable beam spot size are also described. The appropriate uses of PIXE microprobes with the presently attained spatial resolution are discussed. (author)
Additional details
Publishing Information
- Publisher
- Hosei Univ.
- Imprint Place
- Tokyo (Japan)
- Imprint Title
- Report of Research Center of Ion Beam Technology, Hosei University, supplement 3, March 1984
- Imprint Pagination
- 182 p.
- Journal Page Range
- p. 9-14.
Conference
- Title
- 2. symposium on ion beam technology, Hosei University; ion beam analysis.
- Dates
- 2-3 Dec 1983.
- Place
- Tokyo (Japan).
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 16059944
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COLLIMATORS; COMPARATIVE EVALUATIONS; ELECTRON MICROPROBE ANALYSIS; FOCUSING; MEASURING INSTRUMENTS; PIXE ANALYSIS; REVIEWS
- Descriptors DEC
- CHEMICAL ANALYSIS; DOCUMENT TYPES; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; X-RAY EMISSION ANALYSIS