Temperature dependence of the photothermal laser cooling efficiency for a micro-cantilever
Creators
- 1. State Key Laboratory of Magnetic Resonance and Atomic and Molecular Physics, Wuhan Institution of Physics and Mathematics, Chinese Academy of Sciences, Wuhan 430071 (China)
Description
The relationship between the photothermal cooling efficiency of a micro-cantilever's mechanical mode and the environmental temperature is studied. The micro-cantilever and a polished fiber end form a low finesse Fabry—Perot (FP) cavity. Experimental results in a temperature range from 77 K to 298 K show that temperature has an obvious influence on photothermal cooling efficiency. The photothermal cooling efficiency, ηph, at 100 K is 10 times that at 298 K. This accords well with the theoretical analysis that the high photothermal cooling efficiency can be achieved when photothermal response time, τph, and mechanical resonant frequency, ω0, are close to the optimal photothermal cooling condition ω0τph = 1. Our study provides an important approach for high effective photothermal cooling and high-sensitivity measurement for force microscopy. (condensed matter: electronic structure, electrical, magnetic, and optical properties)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-1056/23/10/107801Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. B
- Journal Volume
- 23
- Journal Issue
- 10
- Journal Page Range
- [4 p.]
- ISSN
- 1674-1056
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46072438
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- AMBIENT TEMPERATURE; ATOMIC FORCE MICROSCOPY; COOLING; EFFICIENCY; EXPERIMENTAL DATA; FABRY-PEROT INTERFEROMETER; FIBERS; LASERS; SENSITIVITY; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- DATA; INFORMATION; INTERFEROMETERS; MEASURING INSTRUMENTS; MICROSCOPY; NUMERICAL DATA; TEMPERATURE RANGE