Published July 1995 | Version v1
Journal article

Exposure strategies for polymethyl methacrylate from in situ x-ray absorption near edge structure spectroscopy

  • 1. Department of Physics, State University of New York at Stony Brook, Stony Brook, New York 11794 (United States)

Description

We have observed the chemical changes in PMMA irradiated by x rays in situ. The chemical changes are monitored by micro-x-ray absorption near edge structure spectra at the carbon absorption edge. The loss of the ester group (C=O) and formation of C=C bonds have been determined quantitatively from changes in the intensities of the respective π* resonant peaks as a function of dose. Samples prepared under different conditions were examined. From the dose dependence of bond formation, scission and linking, the performance of the resist can be predicted, so that the preparation strategy, dose, and development can be optimized. copyright 1995 American Vacuum Society

Additional details

Publishing Information

Journal Title
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
Journal Volume
13
Journal Issue
4
Journal Page Range
p. 1477-1483.
ISSN
0734-211X
CODEN
JVTBD9