Part I: nonlinear analysis of three coupled Josephson junctions. Part II. general bond-to-site mapping in aggregation
Creators
Description
The first part of this thesis deals with the analysis of a small array of Josephson junctions, superconducting devices of markedly nonlinear behavior. The components of the array are modeled as resistively-shunted junctions and are driven by direct current. A chapter is provided that reviews the validity and features of such a model for the case of a single junction. This chapter also includes background information on the subjects of bifurcation, chaos, and fractals. In the following chapters, the array of three junctions is studied, first with one driving current and later with an additional bias current. The analysis includes both numerical results from computer simulations and analytic computations using a perturbative approach. The two approaches are shown to be in good agreement. The behavior of the array is dominated by hysteresis effects. The second part of the thesis describes an exact bound-to-site transformation for diffusion-limited aggregation. A review is provided that summarizes the field of aggregation and demonstrates the need for such exact results. The equivalence maps a class of partial adhesion problems on arbitrary lattices to absolute adhesion problems on transformed lattices. Examples are given for diffusion in the presence and absence of an external field
Availability note (English)
University Microfilms Order No. 85-22,232.Additional details
Publishing Information
- Imprint Pagination
- 97 p.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17066954
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Thesis, Non-conventional Literature
- Descriptors DEI
- ADHESION; AGGLOMERATION; ANALYTICAL SOLUTION; COMPUTERIZED SIMULATION; DIFFUSION; HYSTERESIS; JOSEPHSON JUNCTIONS; NONLINEAR PROBLEMS
- Descriptors DEC
- SEMICONDUCTOR JUNCTIONS; SIMULATION