Electric field gradients in topologically disordered networks simulating amorphous fluoride FeF3

Electric field gradient calculations using a point charge model were developed in corner-sharing octahedra random networks, simulating amorphous FeF3 and resulting from the topological defect method. The η value is well estimated to 0.53-0.58 and the topology of the joint distribution P(Vzz, η) is similar to that deduced from previous dense random packing model. (orig.)