Published December 2010
| Version v1
Journal article
Texture analysis by means of EBSD and x-ray diffraction
Creators
- 1. Osaka Prefecture Univ., Graduate School of Engineering, Sakai, Osaka (Japan)
Description
This report explains the expression method of the crystal orientation necessary to the analysis of crystallographic texture. Further the principle, characteristics and noted points of the texture analysis due to EBSD and X-ray diffraction are explained. The results of analysis due to the same sample for the comparison of these two methods are also presented. (M.H.)
Additional details
Publishing Information
- Journal Title
- Keikinzoku
- Journal Volume
- 60
- Journal Issue
- 12
- Journal Page Range
- p. 666-675
- ISSN
- 0451-5994
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 42106816
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; BACKSCATTERING; DISTRIBUTION FUNCTIONS; ELECTRON DIFFRACTION; GRAIN ORIENTATION; MILLER INDICES; SCHULZ METHOD; STRUCTURAL CHEMICAL ANALYSIS; TEXTURE; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIFFRACTION; FUNCTIONS; MICROSTRUCTURE; ORIENTATION; SCATTERING
Optional Information
- Notes
- 24 refs., 12 figs.