Published June 1, 2010 | Version v1
Journal article

Mechanisms of high energy charged particles beams deflection by a bent crystal

  • 1. Akhiezer Institute for Theoretical Physics of NSC KIPT, Kharkov (Ukraine)
  • 2. Karazin Kharkov National University, Kharkov (Ukraine)

Description

From the single point of view we have considered various mechanisms of high energy charged particles beams bending by a bent crystal. These mechanisms are based on multiple scattering of fast particles on bent atomic strings (stochastic mechanism), planar channelling and reflection of particles from crystal atomic planes (the effect of volume reflection). The results of computer simulation which allow to make a comparison between these beams bending mechanisms are presented. The consideration is performed for both positively and negatively charged particles. It is shown that stochastic mechanism is the most effective for negatively charged particles beam bending. The results of simulation under conditions that have been used in last CERN experiments on observation of stochastic mechanism of positively and negatively charged particles beams bending are presented.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/236/1/012030

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
236
Journal Issue
1
Journal Page Range
[5 p.]
ISSN
1742-6596

Conference

Title
8. international symposium on radiation from relativistic electrons in periodic structures
Acronym
RREPS-2009
Dates
7-11 Sep 2009
Place
Moscow (Russian Federation)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42047189
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAMS; BENDING; CERN; CHANNELING; CHARGED PARTICLES; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; CRYSTALS; MULTIPLE SCATTERING; PARTICLES; REFLECTION; STOCHASTIC PROCESSES
Descriptors DEC
DEFORMATION; EVALUATION; INTERNATIONAL ORGANIZATIONS; SCATTERING; SIMULATION