Mechanisms of high energy charged particles beams deflection by a bent crystal
Creators
- 1. Akhiezer Institute for Theoretical Physics of NSC KIPT, Kharkov (Ukraine)
- 2. Karazin Kharkov National University, Kharkov (Ukraine)
Description
From the single point of view we have considered various mechanisms of high energy charged particles beams bending by a bent crystal. These mechanisms are based on multiple scattering of fast particles on bent atomic strings (stochastic mechanism), planar channelling and reflection of particles from crystal atomic planes (the effect of volume reflection). The results of computer simulation which allow to make a comparison between these beams bending mechanisms are presented. The consideration is performed for both positively and negatively charged particles. It is shown that stochastic mechanism is the most effective for negatively charged particles beam bending. The results of simulation under conditions that have been used in last CERN experiments on observation of stochastic mechanism of positively and negatively charged particles beams bending are presented.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/236/1/012030Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 236
- Journal Issue
- 1
- Journal Page Range
- [5 p.]
- ISSN
- 1742-6596
Conference
- Title
- 8. international symposium on radiation from relativistic electrons in periodic structures
- Acronym
- RREPS-2009
- Dates
- 7-11 Sep 2009
- Place
- Moscow (Russian Federation)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42047189
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAMS; BENDING; CERN; CHANNELING; CHARGED PARTICLES; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; CRYSTALS; MULTIPLE SCATTERING; PARTICLES; REFLECTION; STOCHASTIC PROCESSES
- Descriptors DEC
- DEFORMATION; EVALUATION; INTERNATIONAL ORGANIZATIONS; SCATTERING; SIMULATION