Published December 5, 2008
| Version v1
Journal article
Is CO Carbon KVV Auger Electron Emission Affected by the Photoelectron?
Creators
- 1. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577 (Japan)
- 2. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
- 3. Physics Department, Western Michigan University, Kalamazoo, Michigan 49008 (United States)
- 4. Sincrotrone Trieste, 34012 Basovizza, Trieste (Italy)
- 5. Japan Atomic Energy Agency, Kouto 1-1-1, Sayo-cho, Hyogo 679-5148 (Japan)
- 6. Japan Synchrotron Radiation Research Institute, Sayo-gun, Hyogo 679-5198 (Japan)
Description
Angular distributions (ADs) of O+ fragments from C 1s photoexcited CO detected in coincidence with carbon KVV Auger electrons emitted in the horizontal direction were measured at photon energies of 298, 305, 320, and 450 eV. At 450 eV, the ADs are polarization-independent and coincide with the molecular-frame Auger electron angular distribution. All measured ADs can be rationalized as a product of the same molecular-frame Auger electron angular distribution and the axial selectivity in the photoionization process. Thus the interaction between the photoelectron and the Auger electron for the normal Auger decay of CO can be neglected, and the two-step model is a good approximation
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review Letters
- Journal Volume
- 101
- Journal Issue
- 23
- Journal Page Range
- p. 233202-233202.4
- ISSN
- 0031-9007
- CODEN
- PRLTAO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40054165
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ANGULAR DISTRIBUTION; APPROXIMATIONS; CARBON; CARBON MONOXIDE; ELECTRON EMISSION; ELECTRONS; EV RANGE 100-1000; OXYGEN IONS; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTONS; POLARIZATION
- Descriptors DEC
- BOSONS; CALCULATION METHODS; CARBON COMPOUNDS; CARBON OXIDES; CHALCOGENIDES; CHARGED PARTICLES; DISTRIBUTION; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; ENERGY RANGE; EV RANGE; FERMIONS; IONIZATION; IONS; LEPTONS; MASSLESS PARTICLES; NONMETALS; OXIDES; OXYGEN COMPOUNDS; SPECTROSCOPY
Optional Information
- Notes
- (c) 2008 The American Physical Society