Spin reorientation transition in ultrathin Co film on InP(2x4) reconstructed surface
- 1. Department of Physics and Center for Nanospinics of Spintronic Materials, Korea Advanced Institute of Science and Technology 373-1, Yuseong-gu, Daejeon 305-701 (Korea, Republic of)
Description
We have investigated magnetic properties of monolayer (ML)-thickness Co film deposited on InP(2x4) reconstructed surface using in situ surface magneto-optical Kerr effects (SMOKE) measurement system. InP(2x4) reconstructed surface, obtained by several cycles of sputtering-and-annealing process, was confirmed by reflection high energy electron diffraction (RHEED) and scanning tunneling microscopy (STM) measurements. Co film grown on InP(2x4) reconstructed surface shows three distinguishable thickness regions which have different magnetic properties, depending on Co film thickness. In the Co film thickness region smaller than 7 ML, no SMOKE signal was detected. In the thickness region between 8 ML and 15 ML, both longitudinal and polar Kerr hysteresis loops were observed. In the film thickness larger than 16 ML, only longitudinal SMOKE signal without polar signal was detected
Additional details
Identifiers
- DOI
- 10.1063/1.1853873;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 97
- Journal Issue
- 10
- Journal Page Range
- p. 10J114-10J114.3
- ISSN
- 0021-8979
- CODEN
- JAPIAU
Conference
- Title
- 49. annual conference on magnetism and magnetic materials
- Dates
- 7-11 Nov 2004
- Place
- Jacksonville, FL (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37026015
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; COBALT; DEPOSITION; ELECTRON DIFFRACTION; FERROMAGNETIC MATERIALS; HYSTERESIS; INDIUM PHOSPHIDES; INTERFACES; KERR EFFECT; MAGNETIC PROPERTIES; MAGNETO-OPTICAL EFFECTS; REFLECTION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; SIGNALS; SPIN ORIENTATION; SPUTTERING; SURFACES; THICKNESS; THIN FILMS
- Descriptors DEC
- COHERENT SCATTERING; DIELECTRIC PROPERTIES; DIFFRACTION; DIMENSIONS; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; HEAT TREATMENTS; INDIUM COMPOUNDS; MAGNETIC MATERIALS; MATERIALS; METALS; MICROSCOPY; ORIENTATION; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PHYSICAL PROPERTIES; PNICTIDES; SCATTERING; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2005 American Institute of Physics