Experimental widths and shifts for ionized silicon lines

The electron impact profiles of Si II (2D-2P0); (2P0-2D), (2P0-2S) and (2S-2P0) transitions have been measured in a plasma generated in the reflected shock wave of a conventional shock tube. Electron densities were determined by fitting optically the Hβ profiles to the theoretical Stark profiles and checked with pressure and temperature data calculations. Pressures were recorded by two transducers and temperatures were determined from the integrated energy of optically thin Ne lamba 5852 A and Hβ lines and from Planck intensity. The results are compared with other measurements and with theoretical calculations and discussed. (Auth.)