Electronic sensitization of CuO thin films by Cr-doping for enhanced gas sensor response at low detection limit
- 1. Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, Av. Mickiewicza 30, 30-059 Krakow (Poland)
- 2. Faculty of Computer Science, Electronics and Telecommunications, AGH University of Science and Technology, Av. Mickiewicza 30, 30-059 Krakow (Poland)
Description
In this paper we investigate the effect of Cr-doping on the electronic structure of CuO and Cr-doped CuO thin films, which are deposited by DC-pulsed magnetron sputtering at 100 °C. Density Functional Theory calculations explain the effect of Cr dopant, which is introduction of the shallow donor band that decreases the charge carrier concentration. The Cr dopant is shown to be responsible for enhanced sensor response and selectivity towards acetone in ideal (dry air) and in realistic conditions (high relative humidity environment). The chemical and phase compositions are investigated by means of Energy Dispersive x-ray spectroscopy, x-ray Photoelectron Spectroscopy and Grazing Incidence x-ray Diffraction. The surface topography and microstructure are analysed by Scanning Electron Microscopy and Atomic Force Microscopy. The high level of control of the whole fabrication process of Cr-doped CuO thin films in one step and its feasibility for industrial up-scaling, open up a way for the commercial application of this material in gas sensing, catalysis, photovoltaics, using this cost-effective technology. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2053-1591/aae0d8Additional details
Identifiers
Publishing Information
- Journal Title
- Materials Research Express (Online)
- Journal Volume
- 5
- Journal Issue
- 12
- Journal Page Range
- [13 p.]
- ISSN
- 2053-1591
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51094904
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CHARGE CARRIERS; COPPER OXIDES; DENSITY FUNCTIONAL METHOD; DOPED MATERIALS; ELECTRONIC STRUCTURE; PHOTOVOLTAIC EFFECT; SCANNING ELECTRON MICROSCOPY; SENSITIVITY; SENSORS; SOLAR CELLS; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CALCULATION METHODS; CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; DIFFRACTION; DIRECT ENERGY CONVERTERS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; EQUIPMENT; FILMS; MATERIALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRIC CELLS; PHOTOELECTRIC EFFECT; PHOTOELECTRON SPECTROSCOPY; PHOTOVOLTAIC CELLS; SCATTERING; SOLAR EQUIPMENT; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; VARIATIONAL METHODS