Published June 2, 2018 | Version v1
Miscellaneous

Influence of the surface structure of thin ferromagnetic wires on magnetoimpedance

Creators

  • 1. Department of Physics, Faculty of Electrical Engineering and Informatics, Technical University of Kosice, 04200 Kosice (Slovakia)

Description

In presented contribution two types of glass-metal bond are investigated by scanning electron microscope (SEM) equipped with EDS. Firstly, a mechanical bond, which usually provides weaker random joints. Secondly, chemical interaction, where the oxide layer on the metal surface forms a strong bond with the glass. Additionally magneto-impedance measurements are used to determine surface magnetic properties of microwires with and without glass cover. Considering giant magneto-impedance (GMI) effect, which is mainly a surface effect at higher frequencies, is very sensitive to the rotation of magnetization in the shell of a microwire. Thus GMI measurements are often used to determine magnetic anisotropy, hysteresis and residual magnetic domain structure formed around local defects (pits) on the surface of amorphous ferromagnetic microwires. (authors)

Part of:
24th International Conference on Applied Physics of Condensed Matter. Book of Abstracts

Additional details

Publishing Information

Publisher
Slovak University of Technology
Imprint Place
Bratislava (Slovakia)
ISBN
978-80-227-4799-8
Imprint Title
24th International Conference on Applied Physics of Condensed Matter. Book of Abstracts
Imprint Pagination
51 p.
Journal Page Range
1 p.
Report number
INIS-SK--2022-014

Conference

Title
24. International Conference on Applied Physics of Condensed Matter
Acronym
APCOM 2018
Dates
20-22 Jun 2018
Place
Strbske Pleso (Slovakia)

INIS

Country of Publication
Slovakia
Country of Input or Organization
Slovakia
INIS RN
53119831
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
ELECTRIC IMPEDANCE; MAGNETIC TESTING; SCANNING ELECTRON MICROSCOPY; SOLID STATE PHYSICS; TRANSMISSION ELECTRON MICROSCOPY; WIRES
Descriptors DEC
ELECTRON MICROSCOPY; IMPEDANCE; MATERIALS TESTING; MICROSCOPY; NONDESTRUCTIVE TESTING; PHYSICS; TESTING

Optional Information

Contract/Grant/Project number
Project CEDAMNF-CZ.02.1.01/0.0/0.0/15-003/0000358; co-funded by the European Regional Development Fund (ERDF); Project APVV-16-0288
Notes
Imprint:Published also on CDROM 15.3 MBytes in PDF format