Effect of zinc interlayer on ultrasonic spot welded aluminum-to-copper joints
Creators
Description
Dissimilar aluminum (Al) and copper (Cu) metals were joined together using ultrasonic spot welding (USW), a solid state welding technology. The welds were made with and without a zinc (Zn) interlayer to study the microstructural and mechanical properties of weld joints to analyze the effect of the Zn interlayer. USWed Al-to-Cu joints did not produce any intermetallic compounds (IMCs), and only swirls and voids were observed. It was determined through energy dispersive X-ray spectroscopy and X-ray diffraction scans that welds with a Zn interlayer placed in-between the faying surfaces of the base metals formed a composite-like eutectic structure of Al and Al2Cu at the center and Al–Zn and CuZn5 at the edges of the welded joint. Al–Cu joints welded with a Zn interlayer in-between displayed lap shear tensile strengths 25–170% greater than those of the welds without any interlayer
Availability note (English)
Available from http://dx.doi.org/10.1016/j.msea.2014.03.135Additional details
Identifiers
- DOI
- 10.1016/j.msea.2014.03.135;
- PII
- S0921-5093(14)00428-6;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 607
- Journal Page Range
- p. 277-286
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46047738
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM; ALUMINIUM ALLOYS; COPPER; EUTECTICS; INTERMETALLIC COMPOUNDS; MICROSTRUCTURE; SOLIDS; SURFACES; TENSILE PROPERTIES; WELDED JOINTS; WELDING; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY; ZINC
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIFFRACTION; ELEMENTS; FABRICATION; JOINING; JOINTS; MECHANICAL PROPERTIES; METALS; SCATTERING; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.