Suppressed radiation-induced dynamic recrystallization in CrFeCoNiCu high-entropy alloy
Creators
- 1. Department of Materials Science and Engineering, Seoul National University, Seoul 08826 (Korea, Republic of)
- 2. Advanced Analysis Center, Korea Institute of Science and Technology, Seoul 02792 (Korea, Republic of)
- 3. Center for Noncrystalline Materials, Yonsei University, Seoul 03722 (Korea, Republic of)
- 4. Division of Nano & Information Technology, KIST School, University of Science and Technology, Seoul 02792 (Korea, Republic of)
Description
We report a map of irradiation-induced recrystallization and polygonization in a CrFeCoNiCu high-entropy alloy obtained by a precession electron diffraction technique. This orientation map enables the visualization of depth-dependent recrystallization at a glance and reveals the effects of irradiation dose and material entropy. Discontinuous dynamic recrystallization preferentially occurs near the surface, where the irradiation dose is low, but radiation-enhanced diffusion dominantly occurs leading to dislocation climb even at room temperature. Interestingly, in the high-entropy phase with a relatively low stacking fault energy, discontinuous dynamic recrystallizastion is suppressed due to the lower stored energy and grain boundary diffusivity compared low-entropy one.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2020.08.045Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2020.08.045;
- PII
- S1359646220305716;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 190
- Journal Page Range
- p. 158-162
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53123315
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOYS; COMPARATIVE EVALUATIONS; DIFFUSION; DISLOCATIONS; ELECTRON DIFFRACTION; ENTROPY; GRAIN BOUNDARIES; IRRADIATION; PRECESSION; RADIATION DOSES; RECRYSTALLIZATION; STACKING FAULTS; STORED ENERGY; SURFACES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; DOSES; ELECTRON MICROSCOPY; ENERGY; EVALUATION; LINE DEFECTS; MICROSCOPY; MICROSTRUCTURE; PHYSICAL PROPERTIES; SCATTERING; THERMODYNAMIC PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2021 The Authors. Published by Elsevier Ltd on behalf of Acta Materialia Inc.