Low Energy X-ray Photons Induced Changes in Lexan Films
- 1. Microtron Centre, Department of Studies in Physics, Mangalore University, Mangalagangotri 574 199 (India)
- 2. School of Applied Sciences (Physics), REVA University, Bangalore 560 064 (India)
- 3. Raja Ramanna Centre for Advanced Technology, Indore 452 013 (India)
- 4. Savithribhai Phule Pune University, Pune 411 007 (India)
Description
40 keV Synchrotron X-ray photons were made to fall on Lexan polycarbonate films at different exposure time. The low energy X-ray photons assisted modification in terms of physico-chemical properties of Lexan films were studied using Fourier Transform Infrared (FTIR) spectrophotometer, X-Ray Diffractogram (XRD), Vicker's Microhardness Tester, Scanning Electron Microscope (SEM) and Contact Angle Meter. FTIR result mainly includes decrease in the C=C stretching and C-C stretching of aromatics after irradiation. XRD analysis shows a slight decrease in the crystallinity after irradiation. Vicker's microhardness test reveals the decrement in microhardness of Lexan films after irradiation. SEM result shows irradiation induced changes in the surface morphology. Contact angle measurement shows increase in the water contact angle in irradiated Lexan films. (author)
Additional details
Publishing Information
- Journal Title
- Indian Journal of Pure and Applied Physics
- Journal Volume
- 59
- Journal Issue
- 10
- Journal Page Range
- p. 706-710
- ISSN
- 0019-5596
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 53023955
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; MORPHOLOGICAL CHANGES; MORPHOLOGY; STRUCTURAL CHEMICAL ANALYSIS; STRUCTURAL MODELS; VICKERS HARDNESS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; SCATTERING