Published September 1988
| Version v1
Journal article
Estimation of the electron lifetime in tetramethylsilane
Creators
- 1. Waseda Univ., Tokyo (Japan). Science and Engineering Research Lab.
- 2. Saitama Coll. of Health, Urawa (Japan)
Description
The variation of the collected charge with electric field in a diode-type ionization chamber is used to estimate the electron lifetime in tetramethylsilane (TMS). The primary ionizing particles are the 976 keV conversion electrons emitted from a 207Bi source. In the best purity sample of TMS we obtained an electron lifetime of 11±2 μs which corresponds to an attenuation length at 10 kV/cm, equal to 11 cm. The free ion yield at zero electric field, Gf(0), is determined to be 0.51±0.05. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods Phys. Res., Sect. A
- Journal Volume
- 271
- Journal Issue
- 3
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. A.
- Journal Page Range
- 464-470
- ISSN
- 0168-9002
- CODEN
- NIMAE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 19102235
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- CHARGED-PARTICLE TRANSPORT; ELECTRIC FIELDS; ELECTRON COLLISIONS; ELECTRON DETECTION; EXPERIMENTAL DATA; IONIZATION; IONIZATION CHAMBERS; IONS; KEV RANGE 100-1000; LIFETIME; PULSES; SILANES; STOPPING POWER
- Descriptors DEC
- CHARGED PARTICLE DETECTION; CHARGED PARTICLES; COLLISIONS; DATA; DETECTION; ENERGY RANGE; HYDRIDES; HYDROGEN COMPOUNDS; INFORMATION; KEV RANGE; MEASURING INSTRUMENTS; NUMERICAL DATA; RADIATION DETECTION; RADIATION DETECTORS; RADIATION TRANSPORT; SILICON COMPOUNDS