Published November 1999
| Version v1
Journal article
Determination of scanning ranges and reflection dimensions on X-ray rotation patterns at high values of the Lorentz factor
Creators
- 1. Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 117333 (Russian Federation)
Description
A procedure was proposed for the analytical determination of scanning ranges and dimensions of diffraction spots on X-ray rotation patterns within the framework of the Ewald model in the case where the rotation axis is located almost in the diffraction plane. The procedure allows one to estimate the reflection asymmetry and determine limiting angles Υ, at which no integrated intensities can be completely recorded
Additional details
Identifiers
Publishing Information
- Journal Title
- Crystallography Reports
- Journal Volume
- 44
- Journal Issue
- 6
- Journal Page Range
- p. 1071-1073
- ISSN
- 1063-7745
- CODEN
- CYSTE3
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35081522
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Translation
- Descriptors DEI
- ASYMMETRY; DIMENSIONS; REFLECTION; ROTATION; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DIFFRACTOMETERS; MEASURING INSTRUMENTS; MOTION; SCATTERING
Optional Information
- Notes
- Translated from Kristallografiya, ISSN 0023-4761, 44, 1143-1145 (November-December 1999); (c) 1999 MAIK/Interperiodika