Published 1981
| Version v1
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Backscattering analysis of Nb+Sn films
Description
The parameters of energy losses [S] of 3He+ and 4He+ particles backscattered on Nb and Sn are obtained. It is shown that on the basis of the obtained values of [S] it is possible to analyse the composition of Nb+Sn films Up to their thickness approximately 1.3 μm
Availability note (English)
MF available from INIS under the Report Number.Files
14739109.pdf
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Additional details
Additional titles
- Original title (Russian)
- Анализ пленок Нб+Сн методом обратного рассеяния
Publishing Information
- Imprint Pagination
- 7 p.
- Report number
- JINR--14-81-841
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 14739109
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BACKSCATTERING; CHEMICAL COMPOSITION; ENERGY LOSSES; FILMS; HELIUM IONS; HELIUM 3; HELIUM 4; MEV RANGE 01-10; NIOBIUM; NIOBIUM ALLOYS; THICKNESS; TIN; TIN ALLOYS
- Descriptors DEC
- ALLOYS; CHARGED PARTICLES; DIMENSIONS; ELEMENTS; ENERGY RANGE; EVEN-EVEN NUCLEI; EVEN-ODD NUCLEI; HELIUM ISOTOPES; IONS; ISOTOPES; LIGHT NUCLEI; METALS; MEV RANGE; NUCLEI; SCATTERING; STABLE ISOTOPES; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS
Optional Information
- Notes
- 4 refs.; 4 figs.; 1 tab.; submitted to the journal Instrum. Exp. Tech.