Effect of sputtering parameters on the structure, microstructure and magnetic properties of Tb-Fe films
Creators
- 1. Department of Materials Engineering, Indian Institute of Science Bangalore (India)
- 2. Defence Metallurgical Research Laboratory, Hyderabad (India)
Description
The effect of sputtering parameters such as gas pressure and power on the structure, microstructure and magnetic properties of sputtered Tb-Fe thin films was investigated. X-ray diffraction and transmission electron microscopy studies showed that all the films were amorphous in nature irrespective of the sputtering parameters. A fine island kind of morphology was observed at low sputtering power whereas large clusters were seen at higher sputtering power. While the composition of Tb-Fe films remained constant with increasing sputtering power, the magnetic behaviour was found to change from superparamagnetic to ferromagnetic. On the other hand, the increase in argon gas pressure was found to deplete the iron concentration in Tb-Fe thin films, which in turn reduced the anisotropy and Curie temperature. Annealing of the films at 773 K did not result in any crystallization and the magnetic properties were also found to remain unchanged. - Highlights: • The size of Tb-Fe islands increase with increasing sputtering power. • Film deposited at high sputtering power exhibit ferromagnetism. • Increase in Ar pressure reduces the Curie temperature of Tb-Fe film
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2015.03.026Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2015.03.026;
- PII
- S0040-6090(15)00241-2;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 583
- Journal Page Range
- p. 1-6
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47033310
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABUNDANCE; ANISOTROPY; ANNEALING; CRYSTALLIZATION; CURIE POINT; FERROMAGNETISM; IRON; MAGNETIC PROPERTIES; MAGNETIZATION; MICROSTRUCTURE; SPUTTERING; SUPERPARAMAGNETISM; TEMPERATURE RANGE 0400-1000 K; TERBIUM; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; HEAT TREATMENTS; MAGNETISM; METALS; MICROSCOPY; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; RARE EARTHS; SCATTERING; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENTS; TRANSITION TEMPERATURE
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.