Published December 5, 2006 | Version v1
Journal article

Amorphous carbon nitrogenated films prepared by plasma immersion ion implantation and deposition

  • 1. Laboratorio de Plasmas Tecnologicos, UNESP, Unidade Diferenciada Sorocaba/Ipero, Av. Tres de Marco, 511 Alto da Boa Vista, 18087-180 Sorocaba, SP (Brazil)
  • 2. Laboratorio de Plasmas, Departamento de Fisica e Quimica, UNESP, Av. Dr. Ariberto Pereira da Cunha, 333, 12410 516 Guaratingueta, SP (Brazil)
  • 3. Grupo de Fisica de Superficies, Departamento de Fisica Aplicada, Instituto de Fisica Gleb Wataghin, Universidade Estadual de Campinas, 13083-970 Campinas, SP (Brazil)

Description

In this work, an investigation was conducted on amorphous hydrogenated-nitrogenated carbon films prepared by plasma immersion ion implantation and deposition. Glow discharge was excited by radiofrequency power (13.56 MHz, 40 W) whereas the substrate-holder was biased with 25 kV negative pulses. The films were deposited from benzene, nitrogen and argon mixtures. The proportion of nitrogen in the chamber feed (RN) was varied against that of argon, while keeping the total pressure constant (1.3 Pa). From infrared reflectance-absorbance spectroscopy it was observed that the molecular structure of the benzene is not preserved in the film. Nitrogen was incorporated from the plasma while oxygen arose as a contaminant. X-ray photoelectron spectroscopy revealed that N/C and O/C atomic ratios change slightly with R N. Water wettability decreased as the proportion of N in the gas phase increased while surface roughness underwent just small changes. Nanoindentation measurements showed that film deposition by means of ion bombardment was beneficial to the mechanical properties of the film-substrate interface. The intensity of the modifications correlates well with the degree of ion bombardment

Additional details

Identifiers

DOI
10.1016/j.tsf.2006.05.016;
PII
S0040-6090(06)00657-2;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
515
Journal Issue
4
Journal Page Range
p. 1561-1567
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38058123
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ARGON; CARBON; DEPOSITION; FILMS; GLOW DISCHARGES; ION BEAMS; ION IMPLANTATION; MECHANICAL PROPERTIES; MOLECULAR STRUCTURE; NITROGEN; PLASMA; X-RAY PHOTOELECTRON SPECTROSCOPY
Descriptors DEC
BEAMS; ELECTRIC DISCHARGES; ELECTRON SPECTROSCOPY; ELEMENTS; FLUIDS; GASES; NONMETALS; PHOTOELECTRON SPECTROSCOPY; RARE GASES; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.