In situ observation of dislocation dynamics at the TOPO-TOMO beamline at the synchrotron light source ANKA

White beam X-ray topography at the Topo-Tomo beamline of the synchrotron light source ANKA (Research Centre Karlsruhe) is used to monitor in situ the origin and the dynamics of dislocations in silicon at high temperatures. The (100)Si sample with well defined, artificial defects from a nanoindenter was heated in a mirror heater up to 1000 C. During the heating the transmission X-ray topographs were taken with a CCD-camera system continuously every second resulting in a movie of the formation and motion of dislocations. It will be shown, that the indents act as the source for dislocation loops. The dislocations move with about 3.4.10-5 m/sec inside two opposite inclined {111} glide planes. Finally slip bands of 60 -dislocations are formed. The experimental details of the high temperature topography, the analysis of dislocations as well as the first results of the dislocation dynamics and slip band formation are presented.