Published June 2013 | Version v1
Journal article

DLTS Study of plastically deformed copper-doped n-type germanium

  • 1. Russian Academy of Sciences, Institute of Solid State Physics (Russian Federation)

Description

Classical deep level transient spectroscopy (DLTS) and its modification are used to study the time constants of electron capture by substitutional Cus2− atoms and thermal electron emission from Cus3− atoms in plastically deformed Cu-doped n-type germanium. The activation energy Eσ, the electron capture cross-section, the energy E3 of the third acceptor level of Cus/3− atoms, and the ionization entropy are determined. The lack of E3-level broadening, the exponential capture kinetics for a filling-pulse duration of tp ≲ 1 ms, the fact that the Cus/2−/3−-atom recombination parameters are independent of the dislocation density, and the low concentration of Cus/2−/3− atoms in the deformed samples suggest that the DLTS spectra are due to Cus/2−/3− atoms located outside the Read cylinders.

Additional details

Identifiers

Publishing Information

Journal Title
Semiconductors
Journal Volume
47
Journal Issue
6
Journal Page Range
p. 849-855
ISSN
1063-7826
CODEN
SMICES

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Copyright
Copyright (c) 2013 Pleiades Publishing, Ltd.