Device fabrication with precisely placed carbon nanotubes of known chiral vector
- 1. School of Physics and Astronomy, University of Leeds LS2 9JT (United Kingdom)
- 2. Department of Electrical Engineering, Cambridge University CB3 0FA (United Kingdom)
Description
The electrical properties of single walled carbon nanotubes are strongly dependent on their precise atomic configuration and as such it is of great importance to be able to fabricate devices containing individual carbon nanotubes of known structure. We have developed a novel technique that allows for the determination of the chiral indices of an individual carbon nanotube followed by the precise placement of the tube onto pre-patterned electrodes. Carbon nanotubes are grown by chemical vapour deposition onto perforated TEM grids. Electron diffraction is performed on individual carbon nanotubes, the analysis of which reveals their structure. The desired carbon nanotube is then manipulated inside a combined STM, SEM system and placed with high precision onto pre-patterned electrodes.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/241/1/012082Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 241
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- Electron Microscopy and Analysis Group Conference 2009
- Acronym
- EMAG 2009
- Dates
- 8-11 Sep 2009
- Place
- Sheffield (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42054144
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON; CHEMICAL VAPOR DEPOSITION; CHIRALITY; ELECTRICAL PROPERTIES; ELECTRON DIFFRACTION; NANOTUBES; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CHEMICAL COATING; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; SCATTERING; SURFACE COATING