Published 2001
| Version v1
Miscellaneous
X-ray characterization of nano-structured semiconductor systems
Description
no abstract available
Additional details
Publishing Information
- Imprint Title
- IAWS 2001: Inter-American workshop on the use of synchrotron radiation for research and Symposium on nano technologies. Abstracts
- Imprint Pagination
- 113 p.
- Journal Page Range
- p. 35
Conference
- Title
- Inter-American workshop on the use of synchrotron radiation for research and Symposium on nano technologies
- Acronym
- IAWS 2001
- Dates
- 11-13 Feb 2001
- Place
- Campinas, SP (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 34086533
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- ADVANCED LIGHT SOURCE; ANNEALING; CRYSTAL DOPING; DOPED MATERIALS; GERMANIUM SILICIDES; ION IMPLANTATION; IONS; SEMICONDUCTOR MATERIALS; SILICON; SYNCHROTRON RADIATION; SYNCHROTRON RADIATION SOURCES; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- BREMSSTRAHLUNG; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; GERMANIUM COMPOUNDS; HEAT TREATMENTS; IONIZING RADIATIONS; MATERIALS; RADIATION SOURCES; RADIATIONS; SCATTERING; SEMIMETALS; SILICIDES; SILICON COMPOUNDS; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES