Thermal etching of silver: Influence of rolling defects
- 1. Department of Materials, Imperial College London, SW7 2AZ (United Kingdom)
- 2. AWE Aldermaston, Aldermaston, Reading RG7 4PR (United Kingdom)
Description
Silver is well known to be thermally etched in an oxygen-rich atmosphere and has been extensively studied in the laboratory to understand thermal etching and to limit its effect when this material is used as a catalyst. Yet, in many industrial applications the surface of rolled silver sheets is used without particular surface preparation. Here, it is shown by combining FIB-tomography, FIB-SIMS and analytical SEM that the kinetics of thermal etch pitting are significantly faster on rolled Ag surfaces than on polished surfaces. This occurs due to range of interacting phenomena including (i) the reaction of subsurface carbon-contamination with dissolved oxygen to form pores that grow to intersect the surface, (ii) surface reconstruction around corrosion pits and surface scratches, and (iii) sublimation at low pressure and high temperature. A method to identify subsurface pores is developed to show that the pores have (111) and (100) internal facets and may be filled with a gas coming from the chemical reaction of oxygen and carbon contamination. - Highlights: Thermal etching of industrial silver sheets vs. polished silver sheets Effect of annealing atmosphere on the thermal etching of silver: surface and subsurface characterization Link between etch pitting and defects induced by rolling. FIB-tomography coupled with EBSD for determining crystal planes of the facets of subsurface pores. FIB-SIMS characterization to probe the gas confined inside subsurface pores.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchar.2016.05.006Additional details
Identifiers
- DOI
- 10.1016/j.matchar.2016.05.006;
- PII
- S1044-5803(16)30135-8;
Publishing Information
- Journal Title
- Materials Characterization
- Journal Volume
- 118
- Journal Page Range
- p. 112-121
- ISSN
- 1044-5803
- CODEN
- MACHEX
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49038884
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BACKSCATTERING; CARBON; CORROSION; CRYSTALS; DEFECTS; DISSOLVED GASES; ELECTRON DIFFRACTION; ETCHING; ION MICROPROBE ANALYSIS; MASS SPECTROSCOPY; OXYGEN; ROLLING; SCANNING ELECTRON MICROSCOPY; SHEETS; SILVER; SUBLIMATION; SURFACES; TEMPERATURE RANGE 0400-1000 K; TOMOGRAPHY
- Descriptors DEC
- CHEMICAL ANALYSIS; CHEMICAL REACTIONS; COHERENT SCATTERING; DIAGNOSTIC TECHNIQUES; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; EVAPORATION; FABRICATION; FLUIDS; GASES; MATERIALS WORKING; METALS; MICROANALYSIS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; NONMETALS; PHASE TRANSFORMATIONS; SCATTERING; SOLUTES; SPECTROSCOPY; SURFACE FINISHING; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.